BOBO浏览器老司机模式改版特.,爸爸你真棒插曲快来救救我小说 ,白日梦我小说全文免费阅读-白日梦我小说全文免费阅读,圆滚滚的大扔子视频在线观看,同学的母亲中字ID

QT-8400 power device multi-site test system
Explore the infinite possibilities of third-generation transistors

test host

GaN Test Kit

Power Device Test Kit

QT-8400 is composed of test host and test station Test Kit,
There are two types of Test Kit: Power Device Test Kit & GaN Test Kit.

Test Kit
Can be selected according to needs
  • Power Device Test Kit

    Power Device Test Kit for CP testing needs such as MOSFET/SIC, diodes, transistors, etc.

  • GaN Test Kit

    GaN Test Kit for Gallium Nitride testing needs.

105cm
Standing keyboard height
75cm
Sitting keyboard height
Sign design
Stand & sit
quick switch
Heart-touching
user experience

Based on the ergonomic design, the 8400 main case is designed for different environments such as design companies, laboratories, and packaging and testing factories to meet the user's keyboard operation needs in different standing and sitting postures. We have designed a unique guide line. , allowing users to quickly find the recommended keyboard height when standing or sitting, and can also fine-tune it according to personal height differences, which greatly improves operating comfort and efficiency.

* Patent applied

Sign design
Stand & sit
quick switch
Heart-touching
User experience

Based on the ergonomic design, the 8400 main case is designed for different environments such as design companies, laboratories, and packaging and testing factories to meet the user's keyboard operation needs in different standing and sitting postures. We have designed a unique guide line. , allowing users to quickly find the recommended keyboard height when standing or sitting, and can also fine-tune it according to personal height differences, which greatly improves operating comfort and efficiency.

* Patent applied

105cm
Standing keyboard height
75cm
Sitting keyboard height
Parallel testing
doubles efficiency
Supports 2/4/8/16 Site parallel testing to meet customer needs for higher testing efficiency.
Testing needs,
comprehensive coverage
QT-8400 platform provides 20A/100A, 1KV/2KV multi-site test solutions, support extended high voltage/DC modules, up to 8KV, 2000A, support extended avalanche, RGCG, dynamic RDson and other dynamic parameter test modules, to meet the third generation of semiconductor testing needs

QT-8400 GaN

QT-8400 D

Test Range

Dedicated to testing dynamic and static electrical parameters of gallium nitride

Test Range

Dedicated to MOSFET/SIC, diodes, transistors, IGBT and other CP testing.

Parameter index

Floating V/I Source
Voltage 1KV/2KV
20A/100A;

Parameter index

Floating V/I Source
Voltage 1KV/2KV/3KV
20A/100A/200A

Number of parallel tests

2/4/8/16 Site

Number of parallel tests

2/4/8/16 Site

Extensible dynamic modules

LCR test module (CG)
Dynamic RDSON module (supports hard and soft cutting)

Extensible dynamic modules

Avalanche test module (UIS, EAS)
LCR test module (RG, CG)

Expandable high voltage/DC module

Expandable up to 8KV, 2KA

Expandable high voltage/DC module

Expandable up to 8KV, 2KA

Precise measurement

The GaN Test Kit has a built-in precision measurement circuit to achieve accurate measurements at the nA level and mΩ level.

Precise measurement

The Power Device Test Kit has a built-in precision measurement circuit to achieve nA-level and mΩ-level accurate measurements.

Flexible allocation
of board resources
Our equipment adopts a pluggable board architecture, allowing you to flexibly match boards according to your needs, thereby achieving precise control of testing costs.
Comprehensive functions to
meet various needs
The test host boards are all four-quadrant V/I sources, equipped with AWG and oscilloscope, and have comprehensive functions to meet various scanning test needs such as I-V curves.

Built-in oscilloscope graph

AWG Editor
PTS OS is intuitive and easy to use,
Designed for testing & production
We have fully optimized the QT-8400 PTS OS software interface to improve practicality, aesthetics and ease of use. Greatly improve the efficiency of test development, production and debugging and calibration, making it easy for users to operate efficiently.

* Patent applied

舞蹈大赛| 电视剧白色橄榄树| 一人之下第二季| 巴啦啦小魔仙52集全| 地火电视剧| 中央电视台1套在线直播| 英雄有约全集免费观看| 中国式网友| 室外健身器材的安全通用要求| dxo filmpack| 日本女优色涅赖| 《厨房韵母2》动漫下线了吗| 代阳个人所得税时的会计分录 | 惊艳风流在多村| 秒笑喷的搞笑短视频| 想爱都难| 武林外传在线观看| bilibili hd| 恐怖小说视频| 免费网站在线观看人数在显示| 羽小花的远大前程| 捆绑紧缚束缚白丝| 上市驰姿| 新华社每日电讯报| www。tengxun| 欧美电影h版| 暴躁少女10-16岁| 三叉就在线观看完整版免费| 欧美电影一二区| 盒子动漫| 云宫迅音维也纳金色大厅现场版| 林立果未婚妻张宁| 微信群聊| 托德| 看电脑开机了多长时间| 蝶毒全结局攻略| 小蜜桃免费观看高清电视剧