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第三代
半导体测试家族
Third generation semiconductor testing family
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QT-8100 Digital-Analog Hybrid IC Test System (Cable-Mount)

Suitable for conventional DC and AC parameter testing and functional testing of hybrid and analog IC devices. Main test subjects include: power management, digital consumer, motor drive, audio amplifier, operational amplifier, etc.



Suspended power supply

Multiple sites in parallel

Multi-channel high precision

Supports multiple extensions

Model QT-8100
Product Advantages

The digital-analog hybrid IC test system is suitable for conventional DC and AC parameter testing and functional testing of hybrid and analog IC devices. Main test subjects include: power management, digital consumer, motor drive, audio amplifier, operational amplifier, etc.

Key Features ? Float V/I source with 4 quadrants
? Full resource extracted from the test box,support more than 8site test
? Digital speed 51.2MHz, vector depth 64M
? True parallel test, multiple 1000V/20A high voltage and high current
? 18 bit high precision sampling
? Multi-channel analog capability, supports up to 400 VI channels,Multi-channel digital capability, supports a maximum of 256VI channels
? Multi-channel high precision time measurement unit, supporting ns level time measurement
? Support RF module expansion
? Efficient communication configuration for more efficient testing




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